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Temperature shock test chamber
 
 

Purpose
 

This product is applicable for the safe performance test of electronic components and parts and provides the reliable test and product selection test etc; through the chamber test,(linpin) the product reliability can be improved and the quality control can be conducted.

Chamber Structure
 

All functions adopt the computer control with good operation interface so as to ensure the user’s operation and monitoring is more simple and straightforward(linpin).
The cold chamber and hot chamber are controlled independently and the chamber doors are independent of each other so as to enlarge the use range of the test chamber (1 chamber for 3 purposes)(linpin).
A standard lead hole pipe is installed on the top of the chamber in order to facilitate users to lead sensor cable,(linpin) inspection cable etc into the chamber.

Control System
  The switching time between low temperature zone and high temperature zone is not more than 15sec.
The temperature recovery time is not more than 5min.
Standards Applied
  GB/T2423.1.2, GB10592-89, GJB150
Specs & Technical Parameters
 

Model (CM)

WDCJ-162

WDCJ-340

WDCJ-500

WDCJ-010

Workroom Dimensions

45*45*45

60*60*60

80*80*80

100*100*100

Exterior Dimensions

156*87*154.5

171*102*184.5

191*122*226.5

211*142*266.5

Sample Zone Dimensions

30*30*25

45*45*36

65*65*50

85*85*70

Power

 6.5(KW)

8.6(KW) 

 13.5(KW)

15.5KW 

Performance Index

Temperature Range

A:-20℃~200℃ B:-40℃~200℃ C:-60℃~200℃

Temperature Fluctuation

≤±2℃ for high temperature and low temperature

Temperature Fluctuation

≤±0.5℃(Under constant temperauture)

Sample Zone Load

20kg

30kg

50kg

60kg

 
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Add:No.58, Xiangyun Road, Minhang Economic Technical Development Area, Shanghai, China
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